Statistical Analysis of Delay Faults
نویسندگان
چکیده
This paper proposes a statistical analysis of delay faults which is based on the assumption of a linear combination of signal delays along a path. In order to consider distributed signal delays and to reflect that only few paths can be sensitized, the path delay fault model is applied. By choosing appropriate values for parameters, e.g. cycle time and correlations between signal delays, it is possible to adjust this approach to specific design methodologies. The statistical analysis leads to a new measure called Delay Fault Probability (DFP ), which expresses the probability of a delay fault. Statistical analysis in conjunction with ATPG methods improves dynamic testing, as both an enhanced evaluation of the test set quality and a judgement of the dynamic behavior of a circuit is possible.
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تاریخ انتشار 1997